The professionals at Nano Wings Private Limited have rich experience with various state-of-the art analytical instruments employed in materials characterisation. We offer our analytical services related to the following equipments:
- SEM: Scanning Electron Microscope with EDX
- TEM: Transmission Electron Microscope
- AFM: Atomic Force Microscope – Imaging & Force Spectroscopy in terms of adhesion and elasticity mapping
- XRD: X-ray Diffraction – PXRD & VTPXRD
- CLSM: Confocal Laser Scanning Microscope
- Fluorescence Microscope
- FTIR: Fourier Transform Infrared Spectroscopy
- DSC: Differential Scanning Calorimeter
- UV-Vis: UV-Visible spectroscopy
- Nano particle size & zeta potential measurement
- Optical microscopy in different configurations such as OIRM, LLS, DDFLLS with variable angle and temperature options.
We offer three types of analytical solutions…
- Simple raw data of samples offered by customers
- Data analysis
- Data Interpretation
Both data analysis and data interpretation are offered in the form of our R&D consultancy.
Research & Development is our major strength. We would always be ready to discuss the requirements and would be extremely happy to offer the solutions to our valuable customers in their endeavour to probe new and better solutions to their industrial problems. We do our best to offer the innovative solutions to both industries and academic institutes in their quest for better products and academic excellence respectively in a scheduled time line.